ZeqChipTest

Automated test pattern generation (ATPG) with Zeqond scan chains. Fault coverage analysis, BIST integration, yield prediction using R(t) defect density modeling.

Endpoint	POST /api/hardware/test
Auth	api-key
Rate limit	10/min
Category	hardware

Parameters

Name	Type	Required	Description
netlist	object	Yes	Gate-level netlist.
faultModel	string	No	'stuck-at', 'transition', 'path-delay'.
targetCoverage_pct	number	No	Target fault coverage.

Returns

{ testPatterns, faultCoverage_pct, testTime_ms, yieldPrediction_pct, zeqond }

Example

curl -sS -X POST \
  -H "Authorization: Bearer zsm_..." \
  -H "Content-Type: application/json" \
  -d '{
  "netlist": {},
  "faultModel": "stuck-at",
  "targetCoverage_pct": 99
}' \
  "https://zeqsdk.com/api/hardware/test"

This protocol is a named building block — one of the operations you compose inside a state contract. Call it directly with the request above, or invoke it from a contract that fires on your machine's clock. Browse the whole library at GET /api/protocols; fetch this one at GET /api/protocols/zeq-chip-test.